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While analog test generation tools are still in their infancy, the corresponding tools in the digital domain have reached a fair degree of maturity and acceptance. Recognizing this fact, we propose a novel test generation method f o r linear analog circuits that employs well established digital test software t o generate time-domain tests for analog parametric faults. W e transform the analog circuit t o a n equivalent digital circuit, and target only those stuck-at faults in the digital circuit that could possibly capture parametric failures in the original analog circuit. Hence, the sequence of digital test vectors obtained f r o m any test generator represents a test waveform f o r the analog parametric faults. T h e technique is illustrated using examples that show this to be a simple, yet attractive alternative t o costlier simukationbased analog test generation approaches.