Fault-based automatic test generator for linear analog circuits

Nagi, N.; Chatterjee, Abhijit; Balivada, Ashok; Abraham, Jacob A.

doi:10.1109/iccad.1993.580036

Cited by 62 publications

(33 citation statements)

References 5 publications

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“…The determination of the parameters TR ri , OV ri , ST ri , TD ri , according to (4), and S i , according to (5), is automatically performed using post-processing in the graphical analyzer Probe. The macro-definitions TRr, OVr, STr and TDr are created and used for this purpose.…”

Section: (St) V(ov) V(tr) and V(td)mentioning

confidence: 99%

“…Yet, diverse design styles and a multitude of response parameters make analog circuit testing difficult and expensive. This motivates research in structured faultbased approaches [2]- [5]. In such approaches, fault models capture the effect of physical defects on circuit behavior, fault simulation evaluates the detection capabilities of a test set on a set of faults (and measures fault coverage), and test generation derives a minimal test set to detect those faults.…”

Section: Introductionmentioning

confidence: 99%

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A Model- Based Approach to Automatic Diagnosis Using General Purpose Circuit Simulators

Dimitrova

Gadjeva

Bossche

et al. 2006

2006 IEEE International Symposium on Industrial Electronics

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An approach is proposed to automatic testing of analog electronic circuits using PSpice-like general purpose circuit simulators based on parameterized models of the faulty elements. Using time domain response parameters that well characterize the faults, the set of typical faulty variants of the circuit is simulated. Using post-processing of the obtained results and macro-definitions in the graphical analyzer Probe, a diagnosis of parametric faults in the circuit is performed. The models of the faulty elements are defined in the form of parameterized library components for the Cadence PSpice simulator. Examples are given illustrating the proposed approach.

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Section: (St) V(ov) V(tr) and V(td)mentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

A Model- Based Approach to Automatic Diagnosis Using General Purpose Circuit Simulators

Dimitrova

Gadjeva

Bossche

et al. 2006

2006 IEEE International Symposium on Industrial Electronics

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show abstract

“…rise time or bandwidth). Another approach is to build up a 'fault dictionary' of the standard faults characterised for each device or circuit [2][3][4][5][6]. In this case, the fault occurs when the model exhibits specific faulty behaviour that may still meet the specification.…”

Section: Introductionmentioning

confidence: 99%

Behavioural modelling of operational amplifier faults using analogue hardware description languages

Wilson

Kiliç

Ross

et al.

Proceedings of the Fifth IEEE International Workshop on Behavioral Modeling and Simulation. BMAS 2001 (Cat No.01TH8601)

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“…This min-max formulation of the static test problem is extended to the dynamic case (AC) in (Devarayanadurg, 1995). The automatic generation of AC tests has also been addressed in other works (Nagi, 1993b;Slamani, 1995;Mir, 1996a;Cota, 1997). (Nagi, 1993b) uses a heuristic based on sensitivity calculations to choose the circuit frequencies to consider.…”

Section: Fault Simulationmentioning

confidence: 99%

Test and Design-for-Test of Mixed-Signal Integrated Circuits

Lubaszewski

Huertas

Information Technology

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Although most electronic circuits are almost entirely digital, many include at least a small part that is essentially analog. This is due to the need to interface with the real physical world, that is analog in nature. As demanding market segments require ever more complex mixed-signal solutions, high quality tests become essential to meet circuit design specifications in terms of reliability, time-to-market, costs, etc. In order to lower costs associated to traditional specification-driven tests and, additionally, achieve acceptable fault coverages for analog and mixed-signal circuits, it is reasonable to expect that no other solution than a move towards defect-oriented design-for-test methods will be applicable in the near future. Therefore, testing tends to be dominated by embedded mechanisms to allow for accessibility to internal test points, to achieve on-chip test generation, on-chip test response evaluation, or even to make it possible the detection of errors concurrently to the circuit application. Within this context, an overview of existing test methods is given in this chapter, focusing on design-for-testability, built-in self-test and self-checking techniques suitable for the detection of realistic defects in analog and mixedsignal integrated circuits.Analog and mixed-signal test, fault modelling, fault simulation, test generation, defect-oriented test, design-for-test, design-for-testability, built-in self-test, self-checking circuits. Abstract:Keywords:

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Fault-based automatic test generator for linear analog circuits

Cited by 62 publications

References 5 publications

A Model- Based Approach to Automatic Diagnosis Using General Purpose Circuit Simulators

A Model- Based Approach to Automatic Diagnosis Using General Purpose Circuit Simulators

Behavioural modelling of operational amplifier faults using analogue hardware description languages

Test and Design-for-Test of Mixed-Signal Integrated Circuits

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