2011
DOI: 10.1016/j.tsf.2011.01.258
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Electrical transport characteristics of Ni/Pd/n-GaN Schottky barrier diodes as a function of temperature

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Cited by 46 publications
(17 citation statements)
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“…Similar results have been reported by other workers on metal-semiconductor contacts such as Ni/Pd/(n)GaN, Ni/(n)Gap and Au/ZnO [36][37][38]. This inconsistency may be due to the formation of an interfacial layer containing defects [39,40].…”
Section: Capacitance-voltage Characteristics Of the Ni/(n)bi 2 S 3 Scsupporting
confidence: 87%
“…Similar results have been reported by other workers on metal-semiconductor contacts such as Ni/Pd/(n)GaN, Ni/(n)Gap and Au/ZnO [36][37][38]. This inconsistency may be due to the formation of an interfacial layer containing defects [39,40].…”
Section: Capacitance-voltage Characteristics Of the Ni/(n)bi 2 S 3 Scsupporting
confidence: 87%
“…The values of ρ 2 and ρ 3 obtained respectively from the intercepts and the slopes of the experimental data are 0.780 and À0.00186 V in 80-160 K range (distribution 1) and 0.702 and À 0.00403 in 160-300 K range (distribution 2). A similar behavior of double GD has been observed by several researchers [13][14][15][16][17][18].…”
Section: Analysis Of the Barrier Height Inhomogeneitiessupporting
confidence: 86%
“…Therefore, the interface states and interfacial native oxide layer at a metal-semiconductor contact play an important role in the value of the Schottky barrier height (SBH) and modify other characteristics parameters of the devices [9,11,12]. Several researchers [13][14][15][16][17][18] have carried out extensive work on temperature dependent electrical properties of metal-semiconductors contacts and explained the observed anomaly of temperature dependence of Schottky barrier height and ideality factor by invoking two sets of Gaussian voltage dependent Schottky barrier distributions.…”
Section: Introductionmentioning
confidence: 99%
“…With barrier inhomogeneity, current will be crowded in regions of lower barrier height, more so at lower temperature. Thus, increasing barrier height and more ideal Schottky behavior at higher temperature [5,6] is explained.…”
Section: Fig 3c -2 Versus Reverse Voltage Of Co/n-gan Schottky Contact At 300kmentioning
confidence: 91%