Diameter-dependent electrical properties of InN nanowires (NWs) grown by chemical vapor
deposition have been investigated. The NWs exhibited interesting properties of coplanar
deflection at specific angles, either spontaneously, or when induced by other NWs or
lithographically patterned barriers. InN NW-based back-gated field effect transistors
(FETs) showed excellent gate control and drain current saturation behaviors. Both NW
conductance and carrier mobility calculated from the FET characteristics were found to
increase regularly with a decrease in NW diameter. The observed mobility and conductivity
variations have been modeled by considering NW surface and core conduction paths.