1980
DOI: 10.1007/bf01292632
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Electron-phonon interaction inP-doped silicon at low temperatures

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Cited by 12 publications
(14 citation statements)
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“…This indicates the possibility of additional imperfections in these samples. 6,24 A nominal value of A x ϭ11.75ϫ10 Ϫ45 s 3 yields reasonable agreement with the data. This coefficient is about ten times larger than the coefficients of scattering rates due to isotopes, A isotopes ϭ1.32 ϫ10 Ϫ45 s 3 , and lattice distortion, A ␦R ϭ2.66ϫ10 Ϫ45 s 3 .…”
Section: Resultssupporting
confidence: 62%
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“…This indicates the possibility of additional imperfections in these samples. 6,24 A nominal value of A x ϭ11.75ϫ10 Ϫ45 s 3 yields reasonable agreement with the data. This coefficient is about ten times larger than the coefficients of scattering rates due to isotopes, A isotopes ϭ1.32 ϫ10 Ϫ45 s 3 , and lattice distortion, A ␦R ϭ2.66ϫ10 Ϫ45 s 3 .…”
Section: Resultssupporting
confidence: 62%
“…5 The thermal conductivity data for lightly doped samples was fit using Eqs. ͑8͒ and ͑13͒ and the shear deformation parameter, ⌶ u,elec ϭ9 eV, at temperatures below 20 K. The reported values in the literature are ⌶ u,elec ϭ10 eV, 6,24 ⌶ u,elec ϭ8Ϯ0.3 eV, 43 ⌶ u,elec ϭ8.6Ϯ0.2 eV, 44 and ⌶ u,elec ϭ9.5 eV. 45 The thermal conductivity data for heavily doped samples are fitted using the dilatation deformation potential, E D ͑see Table I͒.…”
Section: Resultsmentioning
confidence: 97%
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