Proceedings of the 2003 International Conference on Compilers, Architecture and Synthesis for Embedded Systems 2003
DOI: 10.1145/951710.951734
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Fault-tolerant platforms for automotive safety-critical applications

Abstract: Fault-tolerant electronic sub-systems are becoming a standard requirement in the automotive industrial sector as electronics becomes pervasive in present cars. We address the issue of fault tolerant chip architectures for automotive applications. We begin by reviewing fault-tolerant architectures commonly used in other industrial domains where faulttolerant electronics has been a must for a number of years, e.g., the aircraft manufacturing industrial sector. We then proceed to investigate how these architectur… Show more

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Cited by 112 publications
(31 citation statements)
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“…The work compared the functional monitoring architectures that monitored the hardware executing the application. Baleani et al [18] studied various FT architectures for automotive including lock-step dual processor architecture, loosely-synchronized dual processor architecture, and triple modular redundant architecture. The work, however, did not quantify the architectures' FT capabilities subject to real-time constraints of automotive CPS.…”
Section: Related Workmentioning
confidence: 99%
“…The work compared the functional monitoring architectures that monitored the hardware executing the application. Baleani et al [18] studied various FT architectures for automotive including lock-step dual processor architecture, loosely-synchronized dual processor architecture, and triple modular redundant architecture. The work, however, did not quantify the architectures' FT capabilities subject to real-time constraints of automotive CPS.…”
Section: Related Workmentioning
confidence: 99%
“…Because the failure rateλ 0 is usually very small, of the order of 10 −5 per time unit [2], or even 10 −6 [7,16], we can use the first order approximation of R i (f ) as…”
Section: Reliabilitymentioning
confidence: 99%
“…Finally, they describe in some details a cost effective dual lock-step platform that can be used as a single fail-operational unit or as two fail-silent channels trading fault-tolerance for performance.". Shirvani and McCluskey (1998) describe "the ARGOS project at Stanford CRC. The primary goals of this project are to collect data on the errors that occur in digital integrated circuits in a space environment, to determine the tradeoffs between fault-avoidance and fault-tolerance, and to see if radiation hardening can be avoided by using fault tolerance techniques.…”
Section: Examples From Aerospace and Automotive Industriesmentioning
confidence: 99%