2011
DOI: 10.1063/1.3615800
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Impact of post-metallization annealing on Ge-on-Si photodiodes passivated with silicon dioxide

Abstract: Ge-on-Si photodiodes were fabricated from epitaxial germanium films grown by low-pressure chemical vapor deposition. These vertical p-i-n diodes were passivated with SiO2 deposited by chemical vapor deposition. It is found that the incorporation of a post-metallization anneal reduces the dark current by 1000X for small-area devices, with 10 × 10 μm diodes exhibiting a dark current of 8 nA at −1 V. Metal-oxide-semiconductor capacitors were also fabricated using the same materials and annealing conditions. Capac… Show more

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Cited by 6 publications
(3 citation statements)
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“…SLG integration reduces the complexity and the number of steps compared with 3D device integration [60,251], as well as the total temperature budget to integrate the active detector or modulator on the Si waveguides. A reduced temperature budget decreases the threat to the integrity of the devices processed earlier on the exposed wafer [252][253][254] and allows for flexible hetero-integration. The ease of integration of SLG devices with Si, as well as the reduced footprint of the SLG devices, should afford photonics technology increased cost-effectiveness compared with the competing semiconductor solutions.…”
Section: Wafer-scale Integrationmentioning
confidence: 99%
“…SLG integration reduces the complexity and the number of steps compared with 3D device integration [60,251], as well as the total temperature budget to integrate the active detector or modulator on the Si waveguides. A reduced temperature budget decreases the threat to the integrity of the devices processed earlier on the exposed wafer [252][253][254] and allows for flexible hetero-integration. The ease of integration of SLG devices with Si, as well as the reduced footprint of the SLG devices, should afford photonics technology increased cost-effectiveness compared with the competing semiconductor solutions.…”
Section: Wafer-scale Integrationmentioning
confidence: 99%
“…These dislocations acts as effective electrical traps and generation centers in the depletion region [10,11]. In addition, the generation of minority carriers on the Ge layer surface due to the poor passivation quality of silicon dioxide is another important dark current source [12,13], especially for the small-size Ge (< 10  10 m 2 ) VPIN GePDs, which have a large perimeter to surface area ratio. In order to further reduce the dark current of a VPIN GePD, it is important to know the dark current generation mechanisms, such that specific process and/or epitaxy development can be done to optimize the corresponding aspect of the material quality.…”
Section: Introductionmentioning
confidence: 99%
“…Post metal annealing (PMA) is a well-known treatment used to improve the interfacial properties of materials, which aims at reducing the interface traps between the substrate and a dielectric. [1][2][3] PMA has been applied not only in the enhancement of transistors, but also for other devices that can benefit from an improvement in interface characteristics; in fact, PMA improves the mobility of surface-bound electrons, which immediately leads to an improvement in the performance of semiconductor devices. [4][5][6][7] In these regards, research has been actively conducted to investigate the application of PMA to metal-oxide-semiconductor field-effect transistors (MOSFETs).…”
Section: Introductionmentioning
confidence: 99%