The
presence of threading dislocations in the depletion region
of Hg1–x
Cd
x
Te detectors remains a problem due to its negative impact on the
electrical and electronic properties of these detectors. We used molecular
dynamics (MD) simulations to study the impact of the simulated growth
rate, substrate temperature, and Hg/Te flux ratio on the Hg sticking
coefficient and crystallinity of Hg1–x
Cd
x
Te on a perfect (211)B CdZnTe
substrate during molecular beam epitaxy (MBE) growth. The trends were
consistent with the experiments, namely, a decrease in crystallinity
with an increase in the growth rate, the exponential decrease of the
Hg sticking coefficient with the increase in substrate temperature,
and an optimum substrate temperature and Hg/Te flux ratio for a given
growth rate. We then used one of the optimum growth conditions found
to conduct MD simulations on (211)B CdZnTe substrates with a quadrupole
of either 0° perfect, 60° perfect, 30° partial, or
90° partial dislocations. All dislocations extended into the
epilayer as expected and various phenomena were observedchange
of line direction, movement by climb, and the dissociation of a glide
perfect dislocation into two partials. These phenomena give insight
into the types of low-energy dislocations that may be present in Hg1–x
Cd
x
Te
after MBE growth.