2014
DOI: 10.1088/2053-1591/1/4/046201
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Morphological manipulation of the nonlinear optical response of ZnO thin films grown by thermal evaporation

Abstract: ZnO thin films with different micro-/nano-structured morphologies have been fabricated using thermal evaporation technique. The micro-/nano-structures ranged from dense grains to nanorods and nanowires. The fabricated films were characterized using x-ray diffraction and field emission scanning electron microscopy (FE-SEM) techniques for determining their crystalline behavior and evaluating their morphology, respectively. Photoluminescence (PL) studies revealed two emission peaks in these films, one in the UV r… Show more

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Cited by 37 publications
(7 citation statements)
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“…The result of our article are in excellent agreement with some previously reported NLO of ZnO materials; also, the magnitude of the third-order NLO susceptibilities is at least one order higher compared to that reported in ref. 57. In our current material, it was conrmed that the crystalline quality of the lms is the key factor for the large NLO properties.…”
Section: Optical Limiting Studiesmentioning
confidence: 93%
“…The result of our article are in excellent agreement with some previously reported NLO of ZnO materials; also, the magnitude of the third-order NLO susceptibilities is at least one order higher compared to that reported in ref. 57. In our current material, it was conrmed that the crystalline quality of the lms is the key factor for the large NLO properties.…”
Section: Optical Limiting Studiesmentioning
confidence: 93%
“…The similar analysis process has been reported. [38][39][40][41][42][43] From the experimental results, the 2PA induced conduction band or defect state RSA (two-step 3PA) behavior of AZO nanostructures with different morphologies has been determined. With standard Z scan theory, we extract the effective nonlinear absorption coefficients with the sample approximation.…”
Section: Methodsmentioning
confidence: 99%
“…No pronounced peak was found to have occurred in the visible range of the emission spectrum. This absence implies the formation of high crystal quality of ZnO films without the significant presence of oxygen vacancies [25]. The PL excitation spectrum is also recorded at the emission wavelength of 395 nm.…”
Section: Resultsmentioning
confidence: 99%