“…In Figure 4, Arrhenius plots of the dark current density are compared with results from the InAs 0.87 Sb 0.13 p-i-n. Close agreement was observed between the nBn current densities for the three device areas, showing the suppression of surface currents and confirming the reliability of the data. At À0.1 V applied bias, the dark current densities of the p-i-n are more than two orders of magnitude greater than the nBn at 300 K and more than six orders greater at 200 K. R 0 A values for the p-i-n were measured to be approximately 3 Â 10 À2 Xcm 2 at 220 K. While these are significantly lower than values for InAs 0.89 Sb 0.11 p-i-n diodes grown on native GaSb substrates, reported to be approximately 1 Xcm 2 at the same temperature, 16 R 0 A values for the nBn were found to be in excess of 3 Â 10 3 Xcm 2 at 220 K and in excess of 10 6 Xcm 2 at 150 K. In comparison, typical InSb detectors require cooling to roughly 90 K to achieve R 0 A values of 10 6 Xcm 2 . 17 Notably, these improvements are observed in spite of the mismatched substrate and an additional lattice-mismatch in the absorption layer, showing that the SRH process is strongly suppressed in the nBn whilst, at the same time, achieving an extended cut-off wavelength.…”