1990
DOI: 10.1149/1.2086417
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On the Reactive Evaporation of In and In2 O 3 in an  O 2 Environment

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1990
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Cited by 19 publications
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“…Tipton et al (82) proposed that both nitriding and oxidizing species significantly influence titanium silicide processing, including lateral growth. It has been reported that the oxygen contamination level has to be controlled below 3 ppm in order to form a homogeneous and low resistance silicide layer and to reduce the significant silicide overgrowth (82,83).…”
Section: Suppression Of Lateral Silicide Growth--it Is Known Thatmentioning
confidence: 99%
“…Tipton et al (82) proposed that both nitriding and oxidizing species significantly influence titanium silicide processing, including lateral growth. It has been reported that the oxygen contamination level has to be controlled below 3 ppm in order to form a homogeneous and low resistance silicide layer and to reduce the significant silicide overgrowth (82,83).…”
Section: Suppression Of Lateral Silicide Growth--it Is Known Thatmentioning
confidence: 99%