2001
DOI: 10.1109/41.915408
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Optimized cooling systems for high-power semiconductor devices

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Cited by 17 publications
(15 citation statements)
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“…For cooling efficiency improvements, numerous advancements to the interfacial thermal layers of the package have been investigated [7]- [9]. These concepts include direct mounting of the power stage on a cold plate [10], which eliminates the bulky Cu base plate and in turn removes thermal barriers from the package stack.…”
Section: Introductionmentioning
confidence: 99%
“…For cooling efficiency improvements, numerous advancements to the interfacial thermal layers of the package have been investigated [7]- [9]. These concepts include direct mounting of the power stage on a cold plate [10], which eliminates the bulky Cu base plate and in turn removes thermal barriers from the package stack.…”
Section: Introductionmentioning
confidence: 99%
“…This strategy simplifies the coolant pumping and the heat transfer by avoiding the cost, operation reliability, and complexity problems linked to conventional liquid-pumping systems (Baumann et al, 2001). One particular case of these cooling systems is the convection-forced heat pipe-based thermosyphon investigated in this work (see Fig.…”
Section: Thermosyphon Cooling System Descriptionmentioning
confidence: 99%
“…Besides, IGBT modules are also the most sensitive elements to other system failures. For instance, dysfunctions on the IGBT drivers (Bouscayrol et al, 2006;Steimel, 2004), on the sensing elements to monitor the critical electrical and thermal variables of the inverter (Bose, 2006), on the cooling system (Baumann et al, 2001), and on the capacitors (decoupling or filter) (Malagoni-Buiatti et al, 2010) undoubtedly lead to their destruction (induced-failures). Furthermore, their working conditions can be more adverse when the IGBT power module wears out (Lhommeau et al, 2007), a non-optimum thermal management design has been carried out (Perpiñà et al, 2007a(Perpiñà et al, , 2010b, and external electrical dysfunctions occur (Malagoni-Buiatti et al, 2010).…”
Section: Failures Of Semiconductor Power Devices In Railway Traction mentioning
confidence: 99%
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