2019
DOI: 10.1109/ted.2018.2885817
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Parameter Extraction and Power/Performance Analysis of Monolithic 3-D Inverter (M3INV)

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Cited by 7 publications
(9 citation statements)
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“…This shows the validity of the HSPICE model. DC/AC and transient results were also verified [14] and used in the circuit simulation of various logic circuits in this study. Table 2 shows a summary of internal and external capacitances by metal lines (MLs) and monolithic inter-tier vias (MIVs) of M3DINV.…”
Section: Simulation and Discussionmentioning
confidence: 99%
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“…This shows the validity of the HSPICE model. DC/AC and transient results were also verified [14] and used in the circuit simulation of various logic circuits in this study. Table 2 shows a summary of internal and external capacitances by metal lines (MLs) and monolithic inter-tier vias (MIVs) of M3DINV.…”
Section: Simulation and Discussionmentioning
confidence: 99%
“…( a ) Equivalent circuit of M3DINV [14] consisting of internal and external capacitances, where the capacitance caused by monolithic inter-tier vias (MIVs) and metal lines (MLs) are added. ( b ) Voltage transfer characteristics (VTC) of M3DINV [14]. V SS = 0 V and V DD = 1 V.…”
Section: Figurementioning
confidence: 99%
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“…Recently, many problems occurring in designing next-generation integrated circuits (ICs) have been emerging, owing to continuous scaling for a metal-oxide-semiconductor field-effect transistor (MOSFET). The nanoscale MOSFET has a short channel effect, which increases the standby power by increasing leakage current, and has difficulty in controlling threshold voltage owing to the gate field influence becoming weak in a nanoscale channel [1,2]. Moreover, using MOSFETs to design high-performance ICs is difficult due to the physical limitations of MOSFETs being unable to have a subthreshold swing (SS) of less than 60 mV/dec at room temperature.…”
Section: Introductionmentioning
confidence: 99%
“…JLFETs are advantageous for scale-down, surface mobility degradation, and short-channel effects [ 18 ]. A new circuit simulation model has been proposed in which the M3DIC composed of MOSFETs (M3DIC-MOSFETs) reflect direct current (DC)/alternating current (AC) and transient inter-layer electrical coupling [ 19 ]. However, owing to the absence of a JLFET compact model that considers electrical coupling between the tiers for the circuit simulation of M3DI structures, an accurate circuit simulation for M3DICs is not possible [ 20 , 21 , 22 , 23 ].…”
Section: Introductionmentioning
confidence: 99%