Polarization fatigue and frequency-dependent recovery in Pb(Zr,Ti)O3 epitaxial thin films with SrRuO3 electrodes

Abstract

Fatigue is investigated in epitaxial Pb(Zr,Ti)O3 films grown on SrRuO3∕SrTiO3 substrates with Pt or SrRuO3 (SRO) top electrodes. It was experimentally determined that fatigue occurs irrespective of whether the top electrode is Pt or SRO. The fatigue behavior is strongly dependent on the frequency. A polarization recovery was observed for both types of top electrodes, but the recovery is almost complete for a SRO top electrode and only about 40% from the initial polarization value for Pt top electrodes. The results are tentatively explained by the frequency response of the deep traps and by migration of oxygen vacancies.

Domain-reorientation-induced polarization wake-up of PbTiO3 based ferroelectric thin films

“…Note that the 2P r is enhanced by about 300%, while the saturation polarization (2P s ) remains almost constant (less than 20% change in magnitude). Even though it is known that remnant polarization is increased in polarization rejuvenation of the fatigued capacitors [28,29], such large enhancement of 300% has not been reported. In one example, the remnant polarization was enhanced by 94.6% in the Pb(Zr 0.2 Ti 0.8 )O 3 (PZT) films when irradiated by UV light [16].…”

Polarization recovery in lead zirconate titanate thin films deposited on nanosheets-buffered Si (001)

“…This decay is imputed to the pinning of the domain wall motion due to oxygen vacancies and/or charged point defects. 16 10 In the same paper, a partial recovery of the remnant polarization was reported with a conclusion that further detailed investigations will be required for a clear understanding of the topic. However, it is still an open and intriguing question to know the origins and extent of fatigue and polarization recovery.…”

“…Despite having numerous studies and proposed models on fatigue mechanism, [6][7][8][9][10] physical origin of fatigue is still debatable. In general, fatigue is explained as a manifestation of the accumulation of oxygen vacancies at the electrode/ferroelectric film interface during the switching cycles and pinning of the domain walls by these vacancies.…”

“…However, it is observed that the switchable polarization of PZT films decreases when the PZT films are used for increased number of bipolar-voltage cycles. [6][7][8][9][10] This reduction in the switchable/remnant polarization, i.e. fatigue, limits the reliability and usage of the PZT films in device applications.…”

The Effect of Tungsten Trioxide Thin Films at Ferroelectric–Electrode Boundaries on Fatigue Behaviour

“…''ABO 3 '' perovskite ferroelectrics can suffer fatigue with elemental metallic electrodes after just 10 4 -10 6 cycles, 3) but this can be radically improved by using conductive oxide electrodes such as IrO 2 4) (although oxide electrodes do not guarantee fatigue resistance 5) ) or by doping the ferroelectric with higher valence cations, such as lanthanum. 6) Some bi-layered perovskite aurivillius phases such as strontium bismuth tantalate do not fatigue readily, even with elemental metallic electrodes, up to 10 12 cycles.…”