“…At present, there are several methods for obtaining silicon carbonitride films using both physical and chemical methods of deposition. Among the latter, particular attention is given to methods which use volatile molecular precursors-organosilicon compounds such as hexamethyldisilazane (Me 3 Si) 2 NH [1,2,4,11,12,14,15], tetramenyldisilazane (Me 2 HSi) 2 NH [3,16,17], N bromohexamethyldisila zane (Me 3 Si) 2 NBr [18], (dimethylamino)dimethylsilane Me 2 NHSiMe 2 [19,20], trimethyl(diethylamino)silane Et 2 NSiMe 3 [21], bis(dimethylamino)methylsilane (Me 2 N) 2 HSiMe [9,22], bis(dimethylamino)dimethylsi lane (Me 2 N) 2 SiMe 2 [13,[23][24][25][26], tris(dimethy lamino)silane (Me 2 N) 3 HSi [27,28], dimethyl(2,2 dim ethylhydrazino)silane Me 2 HSiNHNMe 2 and dimethyl bis dimethylhydrazino silane Me 2 Si(NHNMe 2 ) 2 [29,30], bis(trimethylsilyl)carbodiimide (Me 3 Si) 2 N 2 C [4,6,31], hexamethylcyclotrisilazane (Me 2 SiNH) 3 [32][33][34][35], and 1,3 bis(dimethyl silyl) 2,2,4,4 tetrame thylcyclodisilazane (Me 2 HSiNSi) 2 [10]. At present, the effect of the structure and Si : C : N ratio in the molecule of the starting material on the properties of the SiC x N y films has been studied.…”