2015
DOI: 10.1063/1.4919706
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Ultimate response time of high electron mobility transistors

Abstract: Articles you may be interested inGrowth and characterization of AlGaN/GaN/AlGaN double-heterojunction high-electron-mobility transistors on 100-mm Si(111) using ammonia-molecular beam epitaxy

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Cited by 32 publications
(33 citation statements)
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“…25 The device modeled, has a small (4nm) gate-to-channel separation and a 130 nm gate length, so that the UCCM is expected to perform well within the gated region. The results shown in Figure 4c are in excellent agreement with the results of the electro-optic measurements and simulations in the frame of the hydrodynamic model described in 24 . This model predicted the ultra-fast transistor plasmonic response in full agreement with our measurement results.…”
Section: Resultssupporting
confidence: 84%
“…25 The device modeled, has a small (4nm) gate-to-channel separation and a 130 nm gate length, so that the UCCM is expected to perform well within the gated region. The results shown in Figure 4c are in excellent agreement with the results of the electro-optic measurements and simulations in the frame of the hydrodynamic model described in 24 . This model predicted the ultra-fast transistor plasmonic response in full agreement with our measurement results.…”
Section: Resultssupporting
confidence: 84%
“…The detailed COMSOL simulations of the minimum response time based on the hydrodynamic model are presented in [95] for the 2DEG in InGaAs, Si, GaN, and for the two-dimensional hole gas in pdiamond. The simulation results reported in [95] agree well with analytical theory developed in [93] yielding the characteristic inverse response time 1/ r τ in the frame of the hydrodynamic…”
Section: Physics Of Terafets: Ballistic Transport and Plasmonicssupporting
confidence: 81%
“…As predicted in [40], the unique features of the near ballistic response could be revealed by studying "ringing" of the transistor response to short terahertz pulses.…”
mentioning
confidence: 80%