lhis paper presents a new method for detecting defect and fabrication variations in both digital and analog CMOS circuits by simultaneously puking the power supply raik and analyzing the temporal andlor the spectral characteristics of the resulting transient rail currents. lhe method presented has a distinct advantage over other forms of iDD testing because it requires a single test vector to excite and expose the presence of a defect or irregular fabrication process condition. lhis paper presents data fhom simulations and defective IC's supporting this technique.

A hybrid analog-digital neural processing element with the time-dependent behavior of biological neurons has been developed. The hybrid processing element is designed for VLSI implementation and offers the best attributes of both analog and digital computation. Custom VLSI layout reduces the layout area of the processing element, which in turn increases the expected network density. The hybrid processing element operates at the nanosecond time scale, which enables it to produce real-time solutions to complex spatiotemporal problems found in high-speed signal processing applications. VLSI prototype chips have been designed, fabricated, and tested with encouraging results. Systems utilizing the time-dependent behavior of the hybrid processing element have been simulated and are currently in the fabrication process. Future applications are also discussed.

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