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This paper presents an overview of the macro design, architecture, and built-in self-test (BIST) implementation as part of the IBM thirdgeneration embedded dynamic random-access memory (DRAM) for the IBM Blue Logic ® 0.11-m application-specific integrated circuit (ASIC) design system (CU-11). Issues associated with embedding DRAM in an ASIC design are identified and addressed, including fundamental DRAM core function, user interface, test, and diagnosis. Macro operation and organization are detailed and contrasted with traditional DRAM designs. The use of BIST, a key enabler for embedded DRAM, is discussed while highlighting innovations required by the embedded DRAM. the advent of embedded DRAM offerings in a logic-based ASIC technology [3], the performance of embedded DRAM macros has improved significantly over that of DRAM-based technologies. Users are increasingly replacing SRAM implementations with embedded DRAM,

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