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Improving logic density by time-sharing, time-multiplexed FPGAs (TMFPGAs) have become an important research topic for reconfigurable computing. Due to the precedence and capacity constraints in TMFPGAs, the clustering and partitioning problems for TMFPGAs are different from the traditional ones. In this paper, we propose a two-phase hierarchical approach to solve the partitioning problem for TMFPGAs. With the precedence and capacity considerations for both phases, the first phase clusters nodes to reduce the problem size, and the second phase applies a probability-based iterative-improvement approach to minimize cut cost. Experimental results based on the Xilinx TMFPGA architecture show that our algorithm significantly outperforms previous works.

The embedded-DRAM (eDRAM) testing mixes up the techniques used for DRAM testing and SRAM testing since an eDRAM core combines DRAM cells with an SRAM interface (the so-called 1T-SRAM architecture). In this paper, we first present our test algorithm for eDRAM testing. A theoretical analysis to the leakage mechanisms of a switch transistor is also provided, based on that we can test the eDRAM at a higher temperature to reduce the total test time and maintain the same retention-fault coverage. Finally, we propose a mathematical model to estimate the defect level caused by wear-out defects under the use of error-correction-code circuitry, which is a special function used in eDRAMs compared to commodity DRAMs. The experimental results are collected based on 1-lot wafers with an 16 Mb eDRAM core.

This paper presents a novel memory test algorithm, named alternate hammering test, to detect the pairwise word-line hammering faults for application-specific DRAMs. Unlike previous hammering tests, which require excessively long test time, the alternate hammering test is designed scalable to industrial DRAM arrays by considering the array layout for potential fault sites and the highest DRAM-access frequency in real system applications. The effectiveness and efficiency of the proposed alternate hammering test are validated through the test application to an eDRAM macro embedded in a storage-application SoC.

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