2002
DOI: 10.1088/0957-4484/13/4/310
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Electron-phonon interaction in suspended highly doped silicon nanowires

Abstract: We have realized highly doped suspended silicon nanowires with lateral dimensions down to 20 nm for studying electron transport and dissipation phenomena in these wires. Random dopant fluctuations lead to the formation of multiple tunnel junctions, showing Coulomb blockade phenomena at low drain-source bias. In the finite-bias regime we observe relaxation of hot electrons via phonons. Melting of the wires then occurs at high bias values at an extremely large current density of the order of 10 6 A cm −2 .

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Cited by 31 publications
(24 citation statements)
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“…This will be the focus of further investigations. Moreover, the weak coupling between the electrons and the phonon bath, which is typically in place in nano-scale systems because of finitesize effects, 12,13 should be considered. This may lead to exceedingly long thermalisation times on the scale of the time-resolved experiments presented here and consequently result in an increase of the electron temperature.…”
Section: Dqd Ementioning
confidence: 99%
“…This will be the focus of further investigations. Moreover, the weak coupling between the electrons and the phonon bath, which is typically in place in nano-scale systems because of finitesize effects, 12,13 should be considered. This may lead to exceedingly long thermalisation times on the scale of the time-resolved experiments presented here and consequently result in an increase of the electron temperature.…”
Section: Dqd Ementioning
confidence: 99%
“…Typically the high current density in conventional metals can create voids by electromigration and most fail due to Joule heating at ∼10 3 to 10 4 A/cm 2 . There have been efforts to characterize the maximum current density of some individual NWs, for example, PtSi NW [332], Si NW [333], [334], NiSi NW [335], and GaN NW [336], [337]. In exploring the application limits of the InP NW photoconductive switch (see Section III-B), the maximum photoresponse current and thermal breakdown of the device with dc bias under a 780-nm pulsed-laser illumination were studied.…”
Section: F High Current Capacity and Reliability Of Nwsmentioning
confidence: 99%
“…1,2) In addition, MEMSs have recently been miniaturized to sub-micron/nanoscale, which are called nanoelectromechanical systems (NEMS), whose mechanical and electrical properties have extensively been investigated. [3][4][5][6] For example, an oscillation frequency of over 1 GHz has already been reported for a 1.1-mm-long SiC-based beam. 6) Since the operation speed of NEMS increases square inversely proportional to their characteristic lengths, extremely fast NEMS with a switching time close to that of electronic devices may be realized by reducing their dimensions into the 100-nm regime.…”
Section: Introductionmentioning
confidence: 99%