2005
DOI: 10.1016/j.mee.2005.04.032
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Low temperature crystallized Ta2O5/Nb2O5 bi-layers integrated into RIR capacitor for 60 nm generation and beyond

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Cited by 17 publications
(8 citation statements)
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“…Doped Ta 2 O 5 and/or bi-layers containing Ta 2 O 5 are likely to meet these challenges. (10 nm Ta 2 O 5 /$5 nm Nb 2 O 5 bi-layer has another temperature of crystallization as compared with pure Ta 2 O 5 [14].) The concept of doping high-k oxides is that dopants act as network modifiers, can reduce current and interface state density, can also stabilize the amorphous phase.…”
Section: Crystallization Effectsmentioning
confidence: 99%
“…Doped Ta 2 O 5 and/or bi-layers containing Ta 2 O 5 are likely to meet these challenges. (10 nm Ta 2 O 5 /$5 nm Nb 2 O 5 bi-layer has another temperature of crystallization as compared with pure Ta 2 O 5 [14].) The concept of doping high-k oxides is that dopants act as network modifiers, can reduce current and interface state density, can also stabilize the amorphous phase.…”
Section: Crystallization Effectsmentioning
confidence: 99%
“…Also, a comprehensive study has been performed on the pentoxide labelling it as gate dielectrics in complementary metal oxide semiconductors (CMOS) components [35] which as well displays exceptional catalytic qualities. High-κ (kappa) Nb 2 O 5 can be used as a substitute to the traditional gate dielectric of SiO 2 [3,9], so as to satisfy the requirements for miniaturization of the dynamic random-access memory along with the complementary metal oxide semiconductor components [36,37]. The composition of the Nb 2 O 5 films is literally affected by the partial pressure of oxygen and the deposition temperature which may probably lead to an alternation in the dielectric constant [38].…”
Section: Introductionmentioning
confidence: 99%
“…Multilayering Nb2O5 with SiO2 films has allowed one to reduce internal mechanical stress in the optical coating [10] and, of course, tailor the refractive index and reflecting properties of the coatings [8][9]. Nb2O5 itself as a dielectric high permittivity metal oxide has been considered for the application in dynamic random access memories [20,21], also when tailored with Ta2O5 or Al2O3 [22][23][24].…”
Section: Introductionmentioning
confidence: 99%