1989
DOI: 10.1080/09500838908206336
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The effect of the substrate on photothermal deflection spectroscopy measurements of optical absorption in a-Si:H

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Cited by 9 publications
(2 citation statements)
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“…In this report, dark-state energies are assessed in two ways. Experimentally, the assessment is through highly sensitive photothermal deflection spectroscopy (PDS) measurements of energy dissipation resulting from optical excitation in concentrated carotenoid filmsexpected to feature robust conformational disorder in the ground state. Computationally, the assessment is through multireference perturbation theory (MRPT) with the density matrix renormalization group (DMRG) so as to investigate the impact of bond-length alternation on the manifold of states.…”
Section: Introductionmentioning
confidence: 99%
“…In this report, dark-state energies are assessed in two ways. Experimentally, the assessment is through highly sensitive photothermal deflection spectroscopy (PDS) measurements of energy dissipation resulting from optical excitation in concentrated carotenoid filmsexpected to feature robust conformational disorder in the ground state. Computationally, the assessment is through multireference perturbation theory (MRPT) with the density matrix renormalization group (DMRG) so as to investigate the impact of bond-length alternation on the manifold of states.…”
Section: Introductionmentioning
confidence: 99%
“…The higher value for the lc-Si:H sample can be attributed to the coexistence of amorphous and crystalline phases in it. The defect related absorption a 0 at E g 1.3 eV of both untreated (flat) samples levels out at a 0 % 10 1 cm À1 , indicating that the PDS measurements have been partially affected by additional glass substrate absorption at long wavelengths, 23 which was not avoided in our experiment. This assumption is supported by ESR measurements of the untreated (flat) a-Si:H samples, which show dangling bond densities of about 10 16 cm À3 , corresponding to an optical absorption coefficient at 1.3 eV of a 0 % 10 0 cm À1 .…”
Section: B Photothermal Deflection Spectroscopymentioning
confidence: 91%